SNJ54BCT8374AFK
SNJ54BCT8374AFK
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Texas Instruments

SNJ54BCT8374AFK


SNJ54BCT8374AFK
F2441-SNJ54BCT8374AFK
Active
SCAN TEST DEVICES WITH OCTAL D-T
28-CLCC

SNJ54BCT8374AFK ECAD Model


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SNJ54BCT8374AFK Attributes


Type Description Select
Series 54BCT
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature -55°C ~ 125°C
Mounting Type Surface Mount
Package / Case 28-CLCC
Supplier Device Package 28-LCCC (11.43x11.43)

SNJ54BCT8374AFK Overview


Texas Instruments offers a wide range of electronic components for various applications, and one such component is the SNJ54BCT8374AFK. This component can be purchased from FMALL, a reputable supplier of electronic components.

The product page for the SNJ54BCT8374AFK provides detailed information, including pricing, data sheets, available inventory, and technical challenges. It also offers quick access to a comparison list for finding interchangeable electronic parts.

If you're looking for comprehensive data on the SNJ54BCT8374AFK to optimize your supply chain, including cross-references, life cycle, parameters, counterfeit risk, and obsolescence management predictions, please contact our technical support team.

Texas Instruments is committed to providing high-quality electronic components that meet industry standards and exceed customer expectations. Whether you're a professional engineer or a hobbyist, you can trust us to provide reliable and efficient components for your electronic projects.

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